Analysis of carrier recombination coefficients of 3C- and 6H-SiC: Insights into recombination mechanisms in stacking faults of 4H-SiC

نویسندگان

چکیده

In recent years, 4H-SiC power devices have been widely employed in electronic systems owing to their superior performance Si devices. However, stacking faults can degrade the device performance. Stacking be considered as polytype inclusions 4H-SiC. Carrier recombination is a cause for degradation. Understanding carrier different polytypes other than helpful understanding mechanism of degradation due Therefore, this study, we characterized coefficients 3C- and 6H-SiC compared them with those using time-resolved free-carrier absorption measurement method. Recombination at cannot intrinsic polytypes.

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ژورنال

عنوان ژورنال: AIP Advances

سال: 2023

ISSN: ['2158-3226']

DOI: https://doi.org/10.1063/5.0157696